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TM070WA-22L01 Datasheet
Various digital compensation techniques can be applied using a similar concept. Digital techniques can provide better compensation because they can compensate for non- linear zero g offset vs. temperature. A micro-controller or micro-processor would perform the compensation. The acceleration signal and the temperature signal would be digitized using an analog to digital converter. Like in the analog compensation, the first step is to test and characterize the zero g change. The purpose ofthe characterization is to create a look up table or to estimate a mathematical representation ofthe change. For example, the change could be characterized by an equation of the form:
TM070WA-22L01 Price

Mimeters Inches
Dimensions Min Typ. Max Min Typ. Max
A 1175 0.069
al 0.1 0.25 0.004 0.010
a2 1.65 0.065
a3 0.65 0.85 0.026 0.033
b O35 0.48 0.014 0.019
bl 0.19 0.25 0.007 0.010
C O25 0.5 0.010 0.020
cl 450 typ)
D 4.8 5.0 0.189 0.197
E 5.8 6.2 0.228 0.244
e 1.27 0.050
e3 3.81 0.150
F 3.8 4.0 0.150 0.157
L 0.4 1127 0.016 0.050
M 0.6 0.024
S 80 (max)


TM070WA-22L01 on stock
bient temperature range that is required when pro- gramming the M27C801. To activate the ES mode, the programming equipment must force 11.5V t0 12.5V on address line A9 0f the M27C801. Two identifier bytes may then be se- quenced from the device outputs by toggling ad- dress line AO from VIL to VIH. All other address lines must be held at VIL during Electronic Signa- ture mode. Byte 0 (AO = VIL) represents the man- ufacturer code and byte l (AO = VIH) the device identifier code. For the STMicroelectronics M27C801, these two identifier bytes are given in Table 4 and can be read-out on outputs Q7 to QO.

Symbol Value Unit
IT(RMS) 12 A
VDRMNRRM 600 t0 1000 V
IGT O2 t0 15 mA


COMMON SOURCE
PULSE TEST IIII IIlI 1 111
I III
- 55 _
32 Ta = 10 Ooc
7


Life support applications - These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.

i i II bl I I II I I II l I II l III l III l l l l i lil


DEFINITIONS VF = Instantaneous forward voltage (pw = 300as, D = 2%). IR = Instantaneous reverse current. trr = Reverse recovery time at dIF/dt = 100Ns (See Figure 6), summation of to + tb. to = Time to reach peak reverse current at dIF/dt = 100A/~s (See Figure 6). tb = Time from peak IRM to projected zero crossing of IRM based on a straight line from peak IRM through 25% of IRM (See Figure 6) RejC = Thermal resistance junction to case. pw = Pulse width. D = Duty cycle.
the commercial Texas Instruments TMS27C010. It uses CMOS technology for high speed and simple interface with MOS and bipolar circuits. All inputs, including program data inputs, can be driven by Series 74 TTL circuits. Each output can drive one Series 74 TTL circuit without extemal resistors. The data outputs are three-state for connecting multiple devices to a common bus. All programming signals are TTL level. For programming outside the system, existing EPROM programmers can be used. The patented radiation hardened RAD-PAK~ technology incorporates radiation shielding in the microcircuit package. The 27C010RP has a total dose survivability ofgreater than 100 krad (Si). Capable of surviving in space environments, the 27C010RP is ideal for satellite, spacecraft, and space probe missions. This product is offered as a one time programmable product. Itis available in Class S packaging and screening.